Title :
Calibrated broadband electrical characterization of nanowires
Author :
Wallis, T.M. ; Imtiaz, A. ; Nembach, H. ; Bertness, K.A. ; Sanford, N.A. ; Blanchard, P.T. ; Kabos, P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO
Abstract :
We present a technique for broadband electrical characterization of nanowires up to 40 GHz. The technique relies on established on-wafer, microwave calibration methods as well as direct measurement of the capacitive coupling that is in parallel with the nano-wire admittance. GaN nanowire devices are used to demonstrate the measurement technique and their response is found to depend strongly on the quality of electrical contacts and the geometry of the nanowire network.
Keywords :
calibration; nanocontacts; nanoelectronics; nanowires; wide band gap semiconductors; GaN; broadband electrical characterization; capacitive coupling measurement; electrical contacts; frequency 40 GHz; microwave calibration; nanowire admittance; nanowire devices; nanowire network; Admittance measurement; Calibration; Contacts; Gallium nitride; Geometry; Measurement techniques; Microwave devices; Microwave measurements; Microwave theory and techniques; Nanowires;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574964
