Title :
Systematic errors in shot noise thermometer measurements
Author :
Spietz, Lafe ; Tew, W. ; Schoelkopf, R.J.
Author_Institution :
NIST, MD, USA
Abstract :
We report comparisons between the Shot Noise Thermometer (SNT), a primary thermometer based on the electronic noise from a tunnel junction, and the ITS-90 in the temperature range from 4 K to 30 K. The SNT indicates a temperature that is systematically high compared to T90, and we explain the probable origin of this effect. We characterize other systematic effects in the SNT and provide a roadmap for future extensions in the accuracy of the SNT which could make it metrologically useful in the lower-most ranges of the ITS-90 and especially in the range of the PLTS-2000.
Keywords :
measurement errors; shot noise; thermometers; tunnelling; electronic noise; shot noise thermometer measurements; systematic errors; temperature 4 K to 30 K; tunnel junction; Calibration; Equations; Microwave measurements; NIST; Noise measurement; Physics; Power measurement; Temperature distribution; Temperature measurement; Voltage measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574973
