Title :
Material characterization using a quasi-optical measurement system
Author :
Gagnon, N. ; Shaker, J. ; Berini, P. ; Roy, L. ; Petosa, A.
Author_Institution :
Commun. Res. Centre, Ottawa, Ont., Canada
Abstract :
Application of a quasi-optical apparatus in the determination of the constituent parameters of materials is presented in this paper. Correction terms are introduced to remove the errors due to the misplacement of the sample and the calibration procedure. Good agreement was observed between manufacturer specifications and measurements after application of the correction terms.
Keywords :
calibration; measurement errors; permittivity measurement; calibration; dielectric constant; dielectric material; measurement error; quasi-optical measurement system; Antenna measurements; Calibration; Dielectric constant; Dielectric materials; Dielectric measurements; Lenses; Manufacturing; Optical reflection; Performance evaluation; Phase measurement;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034741
