DocumentCode
2281801
Title
Advances in thermoelectric microcooling
Author
Han, Leilei ; Wang, Chunqing
Author_Institution
Electron. Packaging Technol., Harbin Inst. of Technol., Harbin, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
1359
Lastpage
1361
Abstract
As the rapidly increasing integration density of electronics, thermal management is becoming more rigorous for the reliability of microelectronic devices. Advanced thermoelectric microcooling technology is receiving more attention due to advantages, such as long lifetime, no moving parts, and etc. In the past 50 years, researchers have been searching for materials with high ZT. Quasicrystals, such as Al-based icosahedral quasicrystals, which possess peculiar electronic and thermal transport properties are considered to be the candidate for thermoelectric materials. While this work on new compounds is in progress, there have also been a number of attempts to produce thermoelectric materials in which at least one of the dimensions is not much greater than the lattice constant, such as superlattice, nanowire and quantum dot. In 1997, Shakouri and Bowers proposed thermionic emission cooling in heterostructures, in which a potential barrier was used for selective emission of hot electrons, and the evaporative cooling of the electron gas. It is expected that non-planar potential barrier could overcome the conservation of momentum that limits the efficiency of thermionic emission cooling for planar barrier.
Keywords
cooling; integrated circuit reliability; thermal management (packaging); thermoelectricity; integration density; microelectronic devices; planar barrier; reliability; thermal management; thermionic emission cooling; thermoelectric microcooling; Conductivity; Cooling; Materials; Phonons; Temperature dependence; Thermal conductivity; Thermionic emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582813
Filename
5582813
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