Title :
Influence of calibration uncertainties on VNA S-parameter measurements
Author_Institution :
Phys.-Technische Bundesanstalt, Braunschweig, Germany
Abstract :
For the widespread 12-term TMSO calibration of 4-sampler vector network analyzers (VNAs), the sensitivity coefficients of the S-parameters of two-ports are derived with respect to the deviations of the reflection coefficients of the one-port calibration standards used. The obtained expressions are suitable for the establishment of the uncertainty budget.
Keywords :
S-parameters; UHF measurement; calibration; measurement standards; microwave measurement; network analysers; two-port networks; 4-sampler vector network analyzers; S-parameter measurements; TMSO calibration; VNA; calibration uncertainties; one-port calibration standards; reflection coefficients; sensitivity coefficients; two-ports; uncertainty budget; Attenuation; Attenuators; Calibration; Circuits; Equations; Erbium; Measurement standards; Reflection; Scattering parameters; Testing;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034753
