Title :
Characterization of 1-10 000 nF capacitance standard for future CCEM key comparison
Author :
Semenov, Yu.P. ; Shvedov, O.A.
Author_Institution :
D.I. Mendeleyev Inst. for Metrol., St. Petersburg, Russia
Abstract :
The transportable capacitance standard 1 nF-10 /spl mu/F for CCEM key comparison of capacitance is developed. The standard consists of five ceramic dielectric hermetically sealed capacitors with 4 terminal-pair connections. Capacitors are placed into temperature-controlled oven, which maintains a constant (/spl plusmn/0,05/spl deg/C) temperature of about 30/spl deg/C. The long-term measurements have shown that capacitance stability is within the limits of 1-10 ppm per one year, short-term stability is of order of few units of 10/sup -8/.
Keywords :
capacitance measurement; ceramic capacitors; measurement standards; 1 to 10000 nF; 30 degC; CCEM key comparison; ceramic dielectric hermetically sealed capacitor; stability; temperature controlled oven; terminal-pair connection; transportable capacitance standard; Capacitance; Capacitors; Ceramics; Noise measurement; Ovens; Resistance heating; Stability; Standards development; Temperature sensors; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034784