A Modified F50 Technique to Determine the Noise Parameters of Active Microwave Devices

The classical reflectometric and the source-pull tuners methods are all expensive and time-consuming because of the use of broad-band tuners and frequent calibration. Moreover, a complicated algorithm is usually needed to extract accurately the two-port noise feature parameters from the over-determined measured data. Recently, a novel technique is proposed to measure the noise figure at the single source (50 Omega). To improve the accuracy, a modified F ₅₀ Technique is presented here. And an extraction method of four noise parameters from the single measured data of F ₅₀ is also given using the Pospieszalski model of transistor and two-port noise analysis models as the additional information. The experimental results demonstrate the practicability of the presented method as expectation by showing the four noise parameters extracted from the single measurement of F ₅₀ are in agreement with the results obtained from source-pull tuners technique with 13 source admittances.