Title :
SEU readback interval strategy of SRAM-based FPGA for space application
Author :
He Wei ; Wang Yueke ; Xing Kefei ; Chen Li
Author_Institution :
Dept. of Instrum. Sci. & Technol., Nat. Univ. of Defence Technol., Changsha, China
Abstract :
Readback test is a key method of SRAM-based FPGA for space application, the readback interval which means the time between two readback behavior decides the performance of anti-SEU. According to readback test of XQR2V3000, the interval is about 189 ms under 5 MHz readback clock; the average SEU interval is about 461 min by analyzing the remote measure data of FPGA used in one satellite which has already been serving on the orbit of 1100 kms for about 260 days. The readback interval strategy is researched based on the former results, the normal mode and abnormal mode are stated. The research is useful for SRAM-based FPGA for space application.
Keywords :
SRAM chips; artificial satellites; clocks; field programmable gate arrays; space vehicle electronics; SEU readback interval strategy; SRAM-based FPGA; XQR2V3000 readback test; frequency 5 MHz; readback clock; Extraterrestrial measurements; Field programmable gate arrays; Orbits; PROM; Registers; Satellites; Single event upset; Interval strategy; Readback test; SEU; SRAM-based FPGA;
Conference_Titel :
Computer Science and Automation Engineering (CSAE), 2011 IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-8727-1
DOI :
10.1109/CSAE.2011.5952842