• DocumentCode
    2282784
  • Title

    Methodology for predictive calibration of TCAD simulators

  • Author

    Le Carval, G. ; Scheiblin, P. ; Poncet, D. ; Rivallin, P.

  • Author_Institution
    CENG, Grenoble, France
  • fYear
    1997
  • fDate
    8-10 Sept. 1997
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    This paper presents an original methodology for calibrating Technology Computer-Aided Design (TCAD) simulators. This approach associates physical analysis of models, statistical analysis of data, and systematic use of Design of Experiments. This new concept, inspired by the Taguchi´s methodology, allows to minimise the difference between simulations and measurements while being the less sensitive to the fluctuations of the manufacturing process. The methodology fits well with economic constraints by only using the existing data, and by reusing previous calibration works.
  • Keywords
    CAD; calibration; design of experiments; digital simulation; electronic engineering computing; semiconductor device models; semiconductor process modelling; statistical analysis; TCAD simulators; Taguchi methodology; design of experiments; model physical analysis; predictive calibration; statistical data analysis; technology computer-aided design; Analytical models; Calibration; Computational modeling; Computer simulation; Design optimization; Filtering; Fluctuations; Predictive models; Statistical analysis; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 1997. SISPAD '97., 1997 International Conference on
  • Conference_Location
    Cambridge, MA, USA
  • Print_ISBN
    0-7803-3775-1
  • Type

    conf

  • DOI
    10.1109/SISPAD.1997.621366
  • Filename
    621366