Title :
Methodology for predictive calibration of TCAD simulators
Author :
Le Carval, G. ; Scheiblin, P. ; Poncet, D. ; Rivallin, P.
Author_Institution :
CENG, Grenoble, France
Abstract :
This paper presents an original methodology for calibrating Technology Computer-Aided Design (TCAD) simulators. This approach associates physical analysis of models, statistical analysis of data, and systematic use of Design of Experiments. This new concept, inspired by the Taguchi´s methodology, allows to minimise the difference between simulations and measurements while being the less sensitive to the fluctuations of the manufacturing process. The methodology fits well with economic constraints by only using the existing data, and by reusing previous calibration works.
Keywords :
CAD; calibration; design of experiments; digital simulation; electronic engineering computing; semiconductor device models; semiconductor process modelling; statistical analysis; TCAD simulators; Taguchi methodology; design of experiments; model physical analysis; predictive calibration; statistical data analysis; technology computer-aided design; Analytical models; Calibration; Computational modeling; Computer simulation; Design optimization; Filtering; Fluctuations; Predictive models; Statistical analysis; US Department of Energy;
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 1997. SISPAD '97., 1997 International Conference on
Conference_Location :
Cambridge, MA, USA
Print_ISBN :
0-7803-3775-1
DOI :
10.1109/SISPAD.1997.621366