DocumentCode
2282904
Title
A novel method of improving transition delay fault coverage using multiple scan enable signals
Author
Devtaprasanna, N. ; Gunda, A. ; Krishnamurthy, P. ; Reddy, S.M. ; Pomeranz, I.
Author_Institution
Dept. of ECE, Iowa Univ., USA
fYear
2005
fDate
2-5 Oct. 2005
Firstpage
471
Lastpage
474
Abstract
We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of which require the ability to switch at-speed between launch and capture cycles.
Keywords
automatic test pattern generation; boundary scan testing; fault simulation; flip-flops; integrated circuit testing; delay test method; multiple scan enable signals; transition delay fault coverage; Circuit faults; Circuit testing; Delay; Design methodology; Electrical fault detection; Fault detection; Flip-flops; Integrated circuit testing; Signal design; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
Print_ISBN
0-7695-2451-6
Type
conf
DOI
10.1109/ICCD.2005.13
Filename
1524194
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