• DocumentCode
    2282931
  • Title

    Effects of Joule heating on the impact behavior of lead-free Sn-based solder joints

  • Author

    Liu, Sihan ; Liu, Fang ; Li, Zhe ; Xu, Guangchen ; Guo, Fu

  • Author_Institution
    Coll. of Mater. Sci. & Eng., Beijing Univ. of Technol., Beijing, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    652
  • Lastpage
    656
  • Abstract
    Charpy impact behaviors of eutectic SnBi solder joints with and without presence of Joule heating effect were investigated by employing a pendulum-type impact tester. The temperature rise induced by Joule heating effect at joined region can reach to 6.2°C and 1.7°C when the applied electric current was 10 A and 5 A, respectively. In addition, the temperature distribution of solder joints during the steady-state heat conduction was more uninform due to the sufficient mass of Cu substrates at two sides. Most important, the impact absorbed energies were the same regardless of how much of electric current was applied. The microstructure observation confirmed that the fracture mechanism was the same between the solder joints with and without presence of Joule heating effect. The ultimate results suggested that the weakness of solder joint was located at the interfacial layer where stress concentration possibly arose due to the interfacial reaction and the appearance of the Cu6Sn5 and Bi brittle phases.
  • Keywords
    bismuth alloys; copper alloys; eutectic alloys; fracture; heat conduction; impact testing; soldering; solders; substrates; tin alloys; CuSn; Joule heating; SnBi; charpy impact behaviors; copper substrates; electric current; eutectic SnBi solder joints; fracture mechanism; interfacial layer; interfacial reaction; lead-free Sn-based solder joints; pendulum-type impact tester; steady-state heat conduction; Bars; Copper; Current; Heating; Microstructure; Soldering; Joule heating; fracture; impact; solder alloy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582878
  • Filename
    5582878