Title :
Key comparisons for dummies: lessons learned
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
This paper will discuss some of the challenges encountered during a recent key comparison. From these experiences, general lessons will be drawn that should prove useful both for the consultative committees and for future pilot laboratories as they consider organization of future key comparisons.
Keywords :
measurement standards; consultative committees; dummies; key comparison; mutual recognition arrangement; national metrology institutes; pilot laboratories; Continuing education; Energy management; Guidelines; International trade; Laboratories; Metrology; NIST; Particle measurements; Phase measurement; Protocols;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034825
