• DocumentCode
    2283065
  • Title

    Considerations for SIMOX low voltage applications

  • Author

    Alles, M. ; Krull, W.

  • Author_Institution
    Ibis Technol. Corp., Danvers, MA, USA
  • fYear
    1993
  • fDate
    5-7 Oct 1993
  • Firstpage
    102
  • Lastpage
    103
  • Abstract
    The IC industry move to low voltage presents an opportunity to which SIMOX is well suited. In particular, process simplification related to junction engineering and material cost reduction related to use of thinner buried oxide (BOX) are opportunities to enhance the serious commercialization of SIMOX for low voltage applications. This work addresses issues relevant to the application of present and next generation SIMOX materials and devices to low voltage applications. Advantages of SIMOX operation at low voltage are examined, and results of an analytical analysis of the effects of BOX thickness on associated parasitic capacitances are presented. The analysis shows that SIMOX on P-type substrates maintain the reduced capacitance advantages as the BOX is thinned
  • Keywords
    SIMOX; BOX; IC industry; P-type substrates; SIMOX devices; SIMOX materials; buried oxide; commercialization; junction engineering; low voltage applications; material cost; parasitic capacitances; process simplification; Commercialization; Costs; Dielectric substrates; FETs; Impact ionization; Low voltage; Parasitic capacitance; Performance analysis; Silicon; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1993. Proceedings., 1993 IEEE International
  • Conference_Location
    Palm Springs, CA
  • Print_ISBN
    0-7803-1346-1
  • Type

    conf

  • DOI
    10.1109/SOI.1993.344542
  • Filename
    344542