• DocumentCode
    2283096
  • Title

    Implementing caches in a 3D technology for high performance processors

  • Author

    Puttaswamy, Kiran ; Loh, Gabriel H.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., USA
  • fYear
    2005
  • fDate
    2-5 Oct. 2005
  • Firstpage
    525
  • Lastpage
    532
  • Abstract
    3D integration is an emergent technology that has the potential to greatly increase device density while simultaneously providing faster on-chip communication. 3D fabrication involves stacking two or more die connected with a very high-density and low-latency interface. The die-to-die vias that comprise this interface can be treated like regular on-chip metal due to their small size (on the order of lμm) and high speed (sub-F04 die-to-die communication delay). The increased device density and the ability to place and route in the third dimension provide new opportunities for microarchitecture design. In this paper, we first present a brief overview of 3D integration technology. We then focus on the design of on-chip caches using 3D integration. In particular, we show that the dense die-to-die vias enable caches that are 3D-partitioned at the level of individual wordlines or bitlines. This results in a wire length reduction within SRAM arrays, and a reduction in the footprint of individual SRAM banks, which reduces the global routing from the edge of the cache to the banks and back. The wire length reduction provides both power and performance benefits, e.g., 21.5% latency reduction and 30.9% energy reduction for a 512KB cache. We also report that implementing only the caches in 3D, without accounting for possible benefits from implementing other components of the processor in 3D, results in a 12% IPC gain. These results demonstrate some of the potential of this new technology, and motivate further research in 3D microarchitectures.
  • Keywords
    cache storage; integrated circuit design; integrated circuit interconnections; microprocessor chips; 3D fabrication; 3D integration technology; SRAM; die-to-die communication delay; die-to-die vias; microarchitecture design; on-chip caches design; on-chip communication; on-chip metal; processors; wire length reduction; Computer interfaces; Delay; Educational institutions; Integrated circuit interconnections; Integrated circuit technology; Microarchitecture; Microprocessors; Random access memory; Space technology; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
  • Print_ISBN
    0-7695-2451-6
  • Type

    conf

  • DOI
    10.1109/ICCD.2005.65
  • Filename
    1524203