Title :
Ultimate Scaling Projection of Cylindrical 3D SONOS Devices
Author :
Arreghini, Antonio ; Van den Bosch, Geert ; Kar, Gouri Sankar ; Van Houdt, Jan
Author_Institution :
Imec, Leuven, Belgium
Abstract :
We present a thorough investigation of scalability perspectives of 3D SONOS devices through simulations calibrated on cylindrical test structures. We identify the key technological challenge limiting the scalability of this solution and found that, even with the present limitations, 3D SONOS arrays could achieve bit density 3-4 generations ahead of the current planar Floating-Gate technology. Moreover, because of the more demanding constraints, MLC operations will not provide clear benefits over SLC in this technology.
Keywords :
circuit testing; random-access storage; 3D SONOS arrays; current planar floating-gate technology; cylindrical 3D SONOS devices; cylindrical test structures; scalability; ultimate scaling projection; Argon; Computer architecture; Logic gates; Microprocessors; Performance evaluation; SONOS devices; Three dimensional displays;
Conference_Titel :
Memory Workshop (IMW), 2012 4th IEEE International
Conference_Location :
Milan
Print_ISBN :
978-1-4673-1079-6
DOI :
10.1109/IMW.2012.6213682