DocumentCode :
2283270
Title :
Isotopically enriched silicon: the atomic path to the kilogram?
Author :
Friedrich, H. ; Pohl, H.-J. ; Riemann, H. ; Becker, P.
Author_Institution :
Phys.-Technische Bundesanstalt Braunschweig, Germany
fYear :
2002
fDate :
16-21 June 2002
Firstpage :
302
Lastpage :
303
Abstract :
Progress in the experiments for the redefinition of the unit of mass by the X-ray crystal density method is hampered mainly by the insufficient accuracy of silicon molar mass. This paper reports on considerations to calibrate prompt (n,/spl gamma/) spectrometry against data obtained by mass spectrometry. When natural silicon, where df/spl ap/10/sup -6/ is known from mass spectroscopy, is compared with isotopically enriched silicon, two difficulties are overcome: (a) the cross sections etc. cancel out, and (b) the gain in isotopic enrichment is roughly valid for df, too. So, from df=10/sup -6/ we end up with df=6.3/spl times/10/sup -8/ for f/spl ges/0.9995. This material then is used for the fabrication of the 1 kg sphere on which the density and the lattice constant are determined.
Keywords :
crystal growth; density measurement; isotopes; lattice constants; mass measurement; mass spectroscopy; measurement standards; silicon; 1 kg; Si; X-ray crystal density method; cross section cancellation; crystal growth; density determination; isotopic enrichment gain; isotopically enriched silicon; kg sphere fabrication; kilogram mass standard; lattice constant determination; mass spectrometry; prompt spectrometry calibration; silicon molar mass accuracy; unit of mass redefinition; Calibration; Crystalline materials; Crystals; Energy capture; Equations; Fabrication; Lattices; Mass spectroscopy; Neutrons; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
Type :
conf
DOI :
10.1109/CPEM.2002.1034841
Filename :
1034841
Link To Document :
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