Title :
Test for the time independence of the fine structure constant, /spl alpha/, using cryogenic sapphire resonators at microwave frequencies
Author :
Tobar, M.E. ; Hartnett, John
Author_Institution :
Dept. of Phys., Univ. of Western Australia, Crawley, WA, Australia
Abstract :
A new experiment to test for the time independence of the fine structure constant, /spl alpha/, is proposed. The experiment utilizes different polarized modes in a sapphire resonator. When configured as a dual mode sapphire clock, we show that it is possible to undertake a sensitive measurement from the beat frequency between the two modes.
Keywords :
constants; crystal resonators; fine structure; microwave measurement; sapphire; beat frequency; cryogenic sapphire resonators; dual mode sapphire clock; fine structure constant; microwave frequencies; polarized modes; time independence; Anisotropic magnetoresistance; Clocks; Cryogenics; Extraterrestrial measurements; Frequency; Magnetic anisotropy; Magnetic field measurement; Magnetic susceptibility; Paramagnetic resonance; Testing;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034850
