Fast reversed DC measurements using a NbN/TiN/NbN Josephson junction array

Author

Sasaki, H. ; Yamamori, H. ; Fujiki, H. ; Shoji, A.

Author_Institution

Nat. Inst. of Adv. Ind. Sci. & Technol., Japan

fYear

2002

fDate

16-21 June 2002

Firstpage

362

Lastpage

363

Abstract

Fast-reversed DC (FRDC) measurements were performed using a NbN/TiN/NbN Josephson junction array developed at AIST. The Josephson junction array was utilized as an auxiliary voltage-stabilizer for a conventional semiconductor FRDC source. The FRDC-DC difference of a thermal converter was measured either with or without the use of the Josephson voltage-stabilizer. The level of agreement between the two configurations was measured to be better than 1 part in 10/sup 7/.

Keywords

convertors; measurement standards; niobium compounds; superconducting junction devices; titanium compounds; voltage measurement; voltage regulators; FRDC measurements; Josephson voltage-stabilizers; NbN-TiN-NbN; NbN/TiN/NbN Josephson junction array; fast reversed DC measurements; semiconductor FRDC source; thermal converter FRDC- DC difference measurements; voltage standards; Frequency measurement; Josephson junctions; Microwave measurements; NIST; Semiconductor device measurement; Switching converters; Thermoelectricity; Tin; Voltage; Voltmeters;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on

Conference_Location

Ottawa, Ontario, Canada

Print_ISBN

0-7803-7242-5

Type

conf

DOI

10.1109/CPEM.2002.1034872

Filename

1034872