Title :
Improved high-current thin-film multijunction thermal converters
Author :
Kinard, J.R. ; Lipe, T.E. ; Wunsch, T.F.
Author_Institution :
Electron. & Electr. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
We report on the fabrication of new thin-film multijunction thermal converters suitable for the measurement of current and new, simpler multiconverter modules that are much easier to manufacture than previous multiconverter modules.
Keywords :
convertors; electric current measurement; measurement standards; measurement uncertainty; modules; thin film devices; current measurement; current standards; high-current thin-film multijunction thermal converters; measurement uncertainty; multiconverter modules; Assembly; Fabrication; Frequency; Heat sinks; Laboratories; NIST; Printed circuits; Skin effect; Thermal engineering; Transistors;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034873
