Title :
Extension of Swerlein´s algorithm for AC voltage measurement in the frequency domain
Author_Institution :
Normalizacao e Qualidade Ind., Instituto Nacional de Metrologia, Rio de Janeiro, Brazil
Abstract :
A sampling algorithm that uses a high-resolution voltmeter for measuring the RMS value of a sinusoidal voltage waveform is presented. The technique is a modification of a previously described approach. In the new approach the RMS values of the specified harmonics are evaluated by a multiple linear regression algorithm.
Keywords :
frequency-domain analysis; harmonic analysis; signal resolution; signal sampling; statistical analysis; voltage measurement; voltmeters; RMS harmonics; RMS sinusoidal voltage waveform value; Swerlein algorithm; frequency domain AC voltage measurement; high-resolution voltmeter; multiple linear regression algorithm; sampling algorithm; Apertures; Equations; Error correction; Frequency domain analysis; Frequency estimation; Frequency measurement; Frequency response; Sampling methods; Voltage measurement; Voltmeters;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034889
