• DocumentCode
    2284175
  • Title

    Segmentation-free object localization in image collections

  • Author

    Wang, Shao-Chuan ; Wang, Yu-Chiang Frank

  • Author_Institution
    Res. Center for Inf. Technol. Innovation, Acad. Sinica, Taipei, Taiwan
  • fYear
    2010
  • fDate
    19-23 July 2010
  • Firstpage
    1546
  • Lastpage
    1551
  • Abstract
    We propose a novel method to address object localization in a weakly supervised framework. Unlike prior work using exhaustive search methods such as sliding windows, we advocate the use of visual attention maps which are constructed by class-specific visual words. Based on dense SIFT descriptors, these visual words are selected by support vector machines and feature ranking techniques. Therefore, discriminative information is learned and embedded in these visual words. We further refine the constructed map by Gaussian smoothing and cross bilateral filtering to preserve local spatial information of the objects. Very promising localization results are reported on a subset of the Caltech-256 dataset, and our method is shown to improve the state-of-the-art recognition performance using the bag-of-feature (BOF) model.
  • Keywords
    Gaussian processes; feature extraction; image classification; image recognition; image retrieval; information filtering; object recognition; set theory; support vector machines; vocabulary; Caltech-256 dataset; Gaussian smoothing; bag-of-feature model; class-specific visual word; cross bilateral filtering; dense SIFT descriptor; feature ranking technique; image collection; object localization; object recognition; segmentation-free object localization; spatial information; subset; support vector machine; visual attention map; Image segmentation; Object recognition; Pixel; Smoothing methods; Support vector machines; Training; Visualization; Feature ranking; object localization; object recognition; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo (ICME), 2010 IEEE International Conference on
  • Conference_Location
    Suntec City
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-4244-7491-2
  • Type

    conf

  • DOI
    10.1109/ICME.2010.5582948
  • Filename
    5582948