Title :
Statistical uncertainty analysis of CCEM-K2 comparisons of resistance standards
Author :
Zhang, N.F. ; Sedransk, N. ; Jarrett, D.G.
Author_Institution :
Stat. Eng. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Details of the statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. Formulas were derived to determine the uncertainty of the combined difference between the measurements of multiple artifacts by an NMI and the corresponding predictions based on pilot lab measurements. In addition, the uncertainties of the reference value of the key comparison and the degrees of equivalence between two NMIs are obtained.
Keywords :
electric resistance measurement; measurement standards; measurement uncertainty; statistical analysis; CCEM-K2 comparisons; NMI equivalence; combined measurement differences; multiple artifact measurements; pilot lab measurement based predictions; reference value uncertainties; resistance standards; statistical uncertainty analysis; Electric resistance; Electric variables measurement; Electrical resistance measurement; Linear regression; Magnetic separation; Measurement standards; NIST; Resistors; Time measurement; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034898
