DocumentCode
2284277
Title
Correlation between surface degradation and PD wave shape evolution for spherical voids
Author
Garcia-Colon H., V.R.
Author_Institution
Inst. de Investigaciones Electr., Morelos
fYear
1996
fDate
23-26 Sep 1996
Firstpage
317
Lastpage
321
Abstract
The present study reports the recording of partial discharges (PDs) wave shapes using ultra wide band (UWB) techniques and its relation to the surface degradation produced on the surface of a single spherical void. The spherical void was occluded in epoxy resin at the time of molding the sample. The surface degradation was studied by optical and electron scanning microscopy (SEM) showing that the evolution of localized degradation was related to the pulse shape detected on the UWB system. These degradation zones evolved into a tree. This tree is also presented on optical microscopy photographs. Analysis of the wave shape at UWB can therefore correlate directly to ageing and ultimate failure of polymerical insulation
Keywords
epoxy insulation; PD wave shape; UWB pulse shape; ageing; epoxy resin; failure; molding; optical microscopy; partial discharge; polymeric insulation; scanning electron microscopy; spherical void; surface degradation; tree; ultra wide band measurement;
fLanguage
English
Publisher
iet
Conference_Titel
Dielectric Materials, Measurements and Applications, Seventh International Conference on (Conf. Publ. No. 430)
Conference_Location
Bath
ISSN
0537-9989
Print_ISBN
0-85296-670-9
Type
conf
DOI
10.1049/cp:19961049
Filename
607408
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