• DocumentCode
    2284277
  • Title

    Correlation between surface degradation and PD wave shape evolution for spherical voids

  • Author

    Garcia-Colon H., V.R.

  • Author_Institution
    Inst. de Investigaciones Electr., Morelos
  • fYear
    1996
  • fDate
    23-26 Sep 1996
  • Firstpage
    317
  • Lastpage
    321
  • Abstract
    The present study reports the recording of partial discharges (PDs) wave shapes using ultra wide band (UWB) techniques and its relation to the surface degradation produced on the surface of a single spherical void. The spherical void was occluded in epoxy resin at the time of molding the sample. The surface degradation was studied by optical and electron scanning microscopy (SEM) showing that the evolution of localized degradation was related to the pulse shape detected on the UWB system. These degradation zones evolved into a tree. This tree is also presented on optical microscopy photographs. Analysis of the wave shape at UWB can therefore correlate directly to ageing and ultimate failure of polymerical insulation
  • Keywords
    epoxy insulation; PD wave shape; UWB pulse shape; ageing; epoxy resin; failure; molding; optical microscopy; partial discharge; polymeric insulation; scanning electron microscopy; spherical void; surface degradation; tree; ultra wide band measurement;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Dielectric Materials, Measurements and Applications, Seventh International Conference on (Conf. Publ. No. 430)
  • Conference_Location
    Bath
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-670-9
  • Type

    conf

  • DOI
    10.1049/cp:19961049
  • Filename
    607408