DocumentCode :
2284340
Title :
Detection of high-impedance faults in power distribution systems
Author :
Hou, Daqing
Author_Institution :
Electr. Eng., Northeast Univ., Shenyang
fYear :
2007
fDate :
13-16 March 2007
Firstpage :
85
Lastpage :
95
Abstract :
When overhead power lines in solid or low-impedance grounded systems lose supports and fall on poorly conductive surfaces, they generate high-impedance faults (HIFs). These faults are a great public safety concern because the fault currents are generally too small for detection by conventional overcurrent relays. This concern has generated great interest in the detection of downed conductor-related HIFs at the substation level. In this paper, we present an HIF detection algorithm that uses traditional relay logic. The algorithm is easier to understand and simpler to implement than many black-box detection methods such as neural networks. We discuss such key aspects of algorithm design as input quantity selection, generation of a reliable reference, adaptation to feeder ambient load noises, and decision logic based on trending and memories. We use real-world data collected from staged HIF tests and noisy substation loads to validate detection results.
Keywords :
fault location; power distribution faults; power distribution protection; relay protection; black-box detection methods; decision logic; fault currents; high-impedance faults; low-impedance grounded systems; noisy substation loads; overhead power lines; power distribution systems; Electrical fault detection; Fault currents; Fault detection; Ground support; Power distribution; Power generation; Power overhead lines; Power system relaying; Safety; Substations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Systems Conference: Advanced Metering, Protection, Control, Communication, and Distributed Resources, 2007. PSC 2007
Conference_Location :
Clemson, SC
Print_ISBN :
978-1-4244-0854-2
Electronic_ISBN :
978-1-4244-0855-9
Type :
conf
DOI :
10.1109/PSAMP.2007.4740902
Filename :
4740902
Link To Document :
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