DocumentCode :
2284441
Title :
A Design for Failure Analysis (DFFA) Technique to Ensure Incorruptible Signatures
Author :
Kundu, Sandip
Author_Institution :
Dept. of ECE, Massachusetts Univ., Amherst, MA
Volume :
1
fYear :
2006
fDate :
6-10 March 2006
Firstpage :
1
Lastpage :
2
Abstract :
Fast failure analysis is a key enabler in shortening the time between design tape out and product introduction in the market. With faster detection of manufacturability issues, problems associated with parametric variations, model approximations or physical design rules can be fixed faster either at the process control level or at the mask level. Failure analysis can be accelerated with additional hardware support for design-for-testability (DFT) and design-for-failure-analysis (DFFA). In this paper, we focus on one such DFFA technique deployed in the industry, identify its shortcomings and offer improvements to fix deficiencies
Keywords :
design for manufacture; design for testability; failure analysis; design tape out; design-for-failure-analysis; design-for-testability; incorruptible signatures; mask level; model approximations; parametric variations; physical design rules; process control level; Acceleration; Clocks; Counting circuits; Debugging; Failure analysis; Hardware; Manufacturing processes; Process control; Registers; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
Type :
conf
DOI :
10.1109/DATE.2006.244174
Filename :
1656896
Link To Document :
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