DocumentCode
2284756
Title
Global modeling and PIC simulation of low-temperature plasma discharges
Author
Jae Koo Lee ; Lee, H.J. ; Lee, J.H. ; Lim, Y.Y. ; Chung, T.H. ; Lee, S.H. ; Wang, M.C.
Author_Institution
Pohang Univ. of Sci. & Technol., South Korea
fYear
1995
fDate
5-8 June 1995
Firstpage
205
Abstract
Summary form only given, as follows. A global model which includes the time-dependent evolution of spatially averaged plasma parameters is used for studying several different types of low-temperature plasma discharges such as the pseudospark discharge and the inductively coupled plasma discharges. The pulse effect of the applied power source to plasma including secondary electron emission and recombination is extensively investigated. These characteristics are compared (whenever possible) with those from particle-in-cell simulations with Monte-Carlo collisions, which are also used for examining in detail the Paschen breakdown and self-oscillation (with period doubling) properties of a capacitively coupled discharge.
Keywords
discharges (electric); ion recombination; plasma collision processes; plasma oscillations; plasma simulation; secondary electron emission; sparks; Monte-Carlo collisions; Paschen breakdown; applied power source; capacitively coupled discharge; electron recombination; global model; global modeling; inductively coupled plasma discharges; low-temperature plasma discharges; particle-in-cell simulations; period doubling; pseudospark discharge; pulse effect; secondary electron emission; self-oscillation; spatially averaged plasma parameters; time-dependent evolution; Electrons; Fault location; Integrated optics; Nuclear and plasma sciences; Optical pulses; Plasma properties; Plasma simulation; Plasma sources; Shape; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location
Madison, WI, USA
ISSN
0730-9244
Print_ISBN
0-7803-2669-5
Type
conf
DOI
10.1109/PLASMA.1995.531733
Filename
531733
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