• DocumentCode
    2284775
  • Title

    Near infrared spectrometric analysis of titanium dioxide nano particles for size classification

  • Author

    Garmarudi, Amir Bagheri ; Khanmohammadi, Mohammadreza ; Khoddami, Nafizseh ; Shabani, Keyvan

  • Author_Institution
    Dept. of Chem. & Polymer Labs., Eng. Res. Inst., Tehran, Iran
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    451
  • Lastpage
    453
  • Abstract
    Determination of nano particle size is substantial since the nano particle size exerts a significant effect on various properties of nano materials. Proposing non-destructive, accurate and rapid techniques for analytical aims is of high interest. In this research the relationship between particle size and diffuse reflectance (DR) spectra in near infrared region has been applied to introduce a method for estimation of particle size. Back propagation artificial neural network (BP-ANN) as a nonlinear model was applied to estimate average particle size based on near infrared diffuse reflectance spectra. Thirty five different nano TiO2 samples with different particle size were analyzed by DR-FTNIR spectrometry and the obtained data were processed by BP- ANN. The network was trained by 30 samples and was evaluated by remaining 5 samples. In order to establish whether the new method is applicable for estimation of particle size of nano structured samples, the optimized model was applied to analyze 44 nano TiO2 samples. It was observed that ANN using the back-propagation algorithm is capable of generalization and could correctly predict the average particle size of nano-sized particles.
  • Keywords
    backpropagation; infrared spectra; infrared spectrometers; materials science computing; nanoparticles; particle size; reflectivity; titanium compounds; BP-ANN; TiO2; back propagation artificial neural network; diffuse reflectance spectra; nanoparticles; near infrared spectrometric analysis; particle size; size classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697778
  • Filename
    5697778