Characterisation of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays

Author

Lo-Hive, J.P. ; Piquemal, F. ; Behr, R. ; Burroughs, C. ; Seppa, H.

Author_Institution

Lab. Nat. d´Essais, Bur. Nat. de Metrologie, Fontenay Aux Roses, France

fYear

2002

fDate

16-21 June 2002

Firstpage

504

Lastpage

505

Abstract

Three 1 V binary Josephson arrays developed by the NIST, the PTB and the VTT and using respectively SNS (superconductor-normal-superconductor), SINIS (superconductor-insulator-normal-insulator-superconductor) and externally shunted SIS (superconductor-insulator-superconductor) junctions have been tested at BNM-LNE. Preliminary results of direct comparisons with conventional SIS arrays globally show a good agreement of less than 0.5 nV, at any nominal voltages between 41 mV and 1.3 V.

Keywords

measurement standards; programmable circuits; superconductor-insulator-superconductor devices; superconductor-normal-superconductor devices; voltage measurement; 0.5 nV; 1 V; 41 mV to 1.3 V; array nominal voltage; binary Josephson SNS/SINIS series array characterisation; externally shunted SIS junctions; global SIS array comparisons; programmable DC voltage standards; superconductor-insulator-normal-insulator-superconductor junctions; superconductor-insulator-superconductor junctions; superconductor-normal-superconductor junctions; Automation; Frequency; Insulation; Josephson junctions; NIST; Optical filters; Superconducting device noise; Superconducting devices; Thermal loading; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on

Conference_Location

Ottawa, Ontario, Canada

Print_ISBN

0-7803-7242-5

Type

conf

DOI

10.1109/CPEM.2002.1034943

Filename

1034943