DocumentCode :
2284942
Title :
A 2/3-inch 2 M-pixel IT-CCD image sensor with individual p-wells for separate V-CCD and H-CCD formation
Author :
Morimoto, M. ; Orihara, K. ; Mutoh, N. ; Minami, K. ; Hatano, K. ; Furumiya, M. ; Arai, K. ; Nakano, T. ; Kawakami, Y. ; Kawai, S. ; Murakami, I. ; Suwazono, S. ; Tanabe, A. ; Tanaka, T. ; Katoh, S. ; Urayama, Y. ; Kohno, A. ; Takeuchi, E. ; Teranishi, N.
Author_Institution :
NEC Corp., Kanagawa, Japan
fYear :
1994
fDate :
16-18 Feb. 1994
Firstpage :
222
Lastpage :
223
Abstract :
This 2/3-inch optical-lens-format, 2 M-pixel interline-transfer (IT) CCD image sensor achieves large charge handling capability in the vertical CCD (V-CCD), and at the same time ensures sufficient transfer efficiency in the horizontal CCD (H-CCD). A V-CCD/H-CCD connection eliminates the potential barrier caused by separate V-CCD/H-CCD formation. Image sensor performance includes a 40 k-electron charge-handling capability in the V-CCD, leading to a 71 dB dynamic range, and sufficient transfer efficiency in the H-CCD, with no deterioration in V-CCD to H-CCD transfer efficiency. The power consumption is 0.49 W, just 22% of that previously achieved in a 1-inch 2 M pixel frame interline transfer (FIT) CCD. This is possible because the p-well reduces the driving pulse amplitude in the V-CCD and the IT scheme decreases electrode capacitance and driving frequency.<>
Keywords :
CCD image sensors; colour television cameras; high definition television; television camera tubes; 0.49 W; 0.67 in; 2 Mpixel; H-CCD formation; HDTV; IT-CCD image sensor; V-CCD formation; driving pulse amplitude; dynamic range; electrode capacitance; electron charge-handling capability; image sensor performance; individual p-wells; interline transfer; optical-lens-format; power consumption; transfer efficiency; Charge coupled devices; Energy consumption; Image sensors; Impurities; Lenses; Microoptics; Optical noise; Particle beam optics; Pixel; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1994. Digest of Technical Papers. 41st ISSCC., 1994 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-1844-7
Type :
conf
DOI :
10.1109/ISSCC.1994.344661
Filename :
344661
Link To Document :
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