Title :
Probability of pass and probability of fail in pass-or-fail tests
Author_Institution :
Area de Metrologia y Calibracion, INTA, Madrid, Spain
Abstract :
In this paper the probability of pass (PoP) and the probability of fail (PoF) are derived following a metrological approach, in which concepts such as repeatability, number of effective degrees of freedom, level of confidence, coverage factors and expanded uncertainty will play a role.
Keywords :
measurement theory; measurement uncertainty; probability; coverage factors; effective degrees of freedom; expanded uncertainty; level of confidence; measured values; measurement uncertainty; metrological approach; pass-or-fail tests; probability of fail; probability of pass; repeatability; Density measurement; Probability density function; State estimation; Testing;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034957
