• DocumentCode
    2285210
  • Title

    Manipulation and assembly methods for graphene based nano devices

  • Author

    Lai, King Wai Chiu ; Fung, Carman Kar Man ; Chen, Hongzhi ; Yang, Ruiguo ; Song, Bo ; Xi, Ning

  • Author_Institution
    Electr. & Comput. Eng. Dept., Michigan State Univ., East Lansing, MI, USA
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    623
  • Lastpage
    626
  • Abstract
    Recently, global scientists have drawn attentions of study of graphene. Graphene has a lot of potential applications in nanoelectronics and nanophotonics. We have demonstrated to use an electric-field-assisted method to manipulate graphene flakes between metal micro electrodes successfully. The size of the graphene flake can be as large as 15 μm × 15 μm. I-V characteristics of the graphene flakes were obtained and the results indicate that the graphene is a zero band gap material which is consistent with many other studies. Different thicknesses of graphene flakes were measured by using an Atomic Force Microscope (AFM). The measurements also confirmed with Raman spectra and showed that the graphene flakes were few-layer-graphene (FLG) and multi-layer-graphene (MLG). The results demonstrate high potential applications of the electric-field-assisted technique and AFM for the investigation and nanomanipulation of graphene at the nanoscale.
  • Keywords
    Raman spectra; atomic force microscopy; electrophoresis; graphene; multilayers; nanoelectronics; nanofabrication; AFM; C; I-V characteristics; Raman spectra; assembly methods; atomic force microscopy; dielectrophoresis; electric-field-assisted method; few-layer-graphene; graphene based nanodevices; graphene flake; graphene flakes; manipulation method; metal microelectrodes; multilayer-graphene; nanoelectronics; nanophotonics; zero band gap material;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697801
  • Filename
    5697801