• DocumentCode
    2285230
  • Title

    A 17 dB gain, 0.1-70 GHz InP HEMT amplifier IC

  • Author

    Madden, C.J. ; Van Tuyl, R.L. ; Le, M.V. ; Nguyen, L.D.

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • fYear
    1994
  • fDate
    16-18 Feb. 1994
  • Firstpage
    178
  • Lastpage
    179
  • Abstract
    Over the last five years, the 0.1 /spl mu/m gate length indium phosphide high electron mobility transistor (InP HEMT) has been taken from first demonstration to a high-yield, manufacturable monolithic microwave integrated circuit (MMIC) process. Discrete InP HEMT devices have shown transconductances (g/sub m/) as high as 1740 mS/mm and cutoff frequencies (f/sub T/) up to 340 GHz and thus are extremely attractive devices for high gain amplifiers in the 30-100 GHz range. For very broadband instrumentation applications, this process is used to realize a fully-integrated, three-stage, shunt-feedback amplifier with 17 dB gain from 100 MHz to 70 GHz, a gain-bandwidth product the authors believe to be the highest reported for any amplifier. In comparison to distributed amplifiers typically used for such broadband applications, this amplifier has higher gain, better low-frequency response, uses less dc power, and yet has good output power capability. Potentially low-cost MMICs of this type could open the millimeter-wave frequencies to commercial applications.<>
  • Keywords
    III-V semiconductors; MMIC; field effect integrated circuits; indium compounds; microwave amplifiers; wideband amplifiers; 0.1 micron; 0.1 to 70 GHz; 17 dB; HEMT amplifier IC; InP; broadband instrumentation; cutoff frequencies; gain-bandwidth product; high electron mobility transistor; high gain amplifiers; low-frequency response; monolithic microwave integrated circuit; output power capability; shunt-feedback amplifier; transconductances; Broadband amplifiers; Distributed amplifiers; Gain; HEMTs; Indium phosphide; MMICs; MODFETs; Microwave amplifiers; Microwave integrated circuits; Monolithic integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1994. Digest of Technical Papers. 41st ISSCC., 1994 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-1844-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.1994.344679
  • Filename
    344679