DocumentCode :
2285249
Title :
Effects of metallic gates on AC quantum Hall measurements
Author :
Overney, F. ; Jeanneret, Blaise ; Jeckelmann, B.
Author_Institution :
Swi&-, Fed. Office of Metrol. & Accreditation, Bern, Switzerland
fYear :
2002
fDate :
16-21 June 2002
Firstpage :
540
Lastpage :
541
Abstract :
Using a sample with back-gates, a linear frequency dependence of the AC quantum Hall resistance was observed on the plateau i=2 for frequencies ranging from 800 Hz to 5 kHz. The frequency coefficient, and the current dependence of R/sub H/ which depend on potentials applied to the back-gates, can simultaneously be reduced to zero. More interestingly, it is also shown that, by removing these back-gates, the losses are considerably reduced giving a negligible frequency coefficient on the order of (0.006/spl plusmn/0.030) (/spl mu//spl Omega///spl Omega/)/kHz.
Keywords :
bridge instruments; electric resistance measurement; measurement standards; quantum Hall effect; resistors; 800 Hz to 5 kHz; AC bridge; AC quantum Hall measurements; AC quantum Hall resistance; back-gate potential; back-gate removal; current dependence; frequency coefficient; linear frequency dependence; metallic gate effect; Bridge circuits; Cables; Capacitors; Frequency dependence; Leakage current; Magnetic field measurement; Resistors; Roentgenium; Shape measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
Type :
conf
DOI :
10.1109/CPEM.2002.1034961
Filename :
1034961
Link To Document :
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