Title :
A 17 b, 32-channel charge readout IC for multichannel detectors
Author :
Garverick, S.L. ; Skrenes, L. ; Baertsch, R.D. ; Lee, N.C.
Author_Institution :
Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
Multichannel charge-sensitive readout electronics are required in applications including imaging devices and detectors in high-energy physics. Reduced power, increased channel count and digital output are needed. A 128-channel CMOS integrated circuit with a multiplexed analog output has 1 1b estimated dynamic range when operated with 100 pF input shunt capacitance. An 8-channel CMOS integrated circuit uses an auto-ranging analog-to-digital converter (ADC) per channel at 55 mW per channel. This paper describes a 32-channel charge readout IC (CRIC) that converts detector charges to digital codes using a companding ADC to achieve a total dynamic range of 17 b while consuming 15 mW per channel.<>
Keywords :
CMOS integrated circuits; analogue-digital conversion; detector circuits; nuclear electronics; particle detectors; 128-channel CMOS integrated circuit; 15 mW; 32-channel; 32-channel charge readout IC; CMOS integrated circuit; auto-ranging analog-to-digital converter; charge readout IC; companding ADC; detector charges; detectors; digital codes; digital output; dynamic range; high-energy physics; imaging devices a; increased channel count; input shunt capacitance; multichannel charge-sensitive readout electronics; multichannel detectors; multiplexed analog output; reduced power; total dynamic range; 1f noise; Analog-digital conversion; Capacitance; Counting circuits; Detectors; Dynamic range; Low pass filters; Sampling methods; Timing; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1994. Digest of Technical Papers. 41st ISSCC., 1994 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-1844-7
DOI :
10.1109/ISSCC.1994.344685
