Title :
Drift compensation technique of an area-varying capacitive displacement sensor for nanometer resolution
Author :
Kang, Daesil ; Lee, Wongoo ; Moon, Wonkyu
Author_Institution :
Mech. Eng. Dept., POSTECH, Pohang, South Korea
Abstract :
Since a widely-used gap variation type capacitive displacement sensor has small measurable range, an area-variation type capacitive displacement sensor was proposed for a larger measurable range. The area-variation type sensors, however, may show considerably large drifts in its out signals. The drift is thought to be caused by such parameters as stage alignment errors, thermal effects, external electric waves, etc. In this study, the drift is successfully reduced without loss in SNR (signal to noise ratio) by adopting two sets of electrodes.
Keywords :
capacitive sensors; displacement measurement; area varying capacitive displacement sensor; drift compensation technique; nanometer resolution; signal to noise ratio;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2010.5697811