DocumentCode :
2285387
Title :
Drift compensation technique of an area-varying capacitive displacement sensor for nanometer resolution
Author :
Kang, Daesil ; Lee, Wongoo ; Moon, Wonkyu
Author_Institution :
Mech. Eng. Dept., POSTECH, Pohang, South Korea
fYear :
2010
fDate :
17-20 Aug. 2010
Firstpage :
718
Lastpage :
721
Abstract :
Since a widely-used gap variation type capacitive displacement sensor has small measurable range, an area-variation type capacitive displacement sensor was proposed for a larger measurable range. The area-variation type sensors, however, may show considerably large drifts in its out signals. The drift is thought to be caused by such parameters as stage alignment errors, thermal effects, external electric waves, etc. In this study, the drift is successfully reduced without loss in SNR (signal to noise ratio) by adopting two sets of electrodes.
Keywords :
capacitive sensors; displacement measurement; area varying capacitive displacement sensor; drift compensation technique; nanometer resolution; signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
ISSN :
1944-9399
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2010.5697811
Filename :
5697811
Link To Document :
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