DocumentCode :
2285591
Title :
Superconductive single-flux quantum technology
Author :
Mukhanov, O.A.
Author_Institution :
HYPRES Inc., Elmsford, NY, USA
fYear :
1994
fDate :
16-18 Feb. 1994
Firstpage :
126
Lastpage :
127
Abstract :
Key digital circuits for signal processing with tens of gigahertz speed and a few microwatts power dissipation have been recently demonstrated using a simple, 2 /spl mu/m linewidth process. These are the fastest digital circuits reported to date. These circuits use novel rapid single flux quantum (RSFQ) technology that takes advantage of the fundamental properties of superconductivity. In this technology, data and clock are picosecond-long quantized voltage pulses corresponding to the transfer of single magnetic flux quanta, /spl Phisub 0/=h/2e=2 mVps. These SFQ pulses are regenerated at each gate and are processed by circuits comprised of overdamped Josephson junctions interconnected via microstrip inductances. The inherent internal memory of all RSFQ gates (primarily flip-flops), combined with high switching speed, makes serial, bit-pipelined circuit design advantageous. This paper presents experiments in RSFQ digital circuits, including an N/spl times/8b serial multiplier, and on-chip test systems based on RSFQ shift registers and on SFQ samplers. They enable test and study of RSFQ circuits at full GHz speed while communicating with semiconductor electronics at low speed.<>
Keywords :
Josephson effect; digital integrated circuits; electron device testing; flip-flops; integrated circuit testing; multiplying circuits; shift registers; superconducting integrated circuits; superconducting junction devices; superconducting logic circuits; 2 micron; Nb-AlO-Nb; RSFQ gates; RSFQ shift registers; RSFQ technology; SFQ samplers; digital circuits; flip-flops; high switching speed; microstrip inductances; onchip test systems; overdamped Josephson junctions; rapid single flux quantum; serial bit-pipelined circuit design; serial multiplier; single-flux quantum technology; superconductivity; Circuit testing; Clocks; Digital circuits; Digital signal processing; Electronic equipment testing; Magnetic flux; Power dissipation; Pulse circuits; Superconductivity; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1994. Digest of Technical Papers. 41st ISSCC., 1994 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-1844-7
Type :
conf
DOI :
10.1109/ISSCC.1994.344703
Filename :
344703
Link To Document :
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