Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production

Author

Yurchenko, Alexey ; Ohorzina, Alena ; Nikcolenko, Kirill

Author_Institution

Department of Information-Measuring Engineering, Tomsk Polytechnic University, Tomsk Russia

fYear

2012

fDate

18-21 Sept. 2012

Firstpage

1

Lastpage

3

Abstract

The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.

Keywords

electric resistance measurement; elemental semiconductors; microwave detectors; microwave measurement; plates (structures); silicon; solar absorber-convertors; solar cells; Si; charge carriers recombination life time; electro-physical parameters; microwave measurement method; multysilicon; noncontact express measurement; photo-electric converter manufacturing; polysilicon; silicon plates; solar cells production; specific electric resistance measurement; Electrical resistance measurement; Microwave measurements; Microwave oscillators; Microwave theory and techniques; Resistance; Semiconductor device measurement; Silicon; Electrical Properties; Multicrystalline Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Strategic Technology (IFOST), 2012 7th International Forum on

Conference_Location

Tomsk

Print_ISBN

978-1-4673-1772-6

Type

conf

DOI

10.1109/IFOST.2012.6357754

Filename

6357754