Title :
Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production
Author :
Yurchenko, Alexey ; Ohorzina, Alena ; Nikcolenko, Kirill
Author_Institution :
Department of Information-Measuring Engineering, Tomsk Polytechnic University, Tomsk Russia
Abstract :
The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.
Keywords :
electric resistance measurement; elemental semiconductors; microwave detectors; microwave measurement; plates (structures); silicon; solar absorber-convertors; solar cells; Si; charge carriers recombination life time; electro-physical parameters; microwave measurement method; multysilicon; noncontact express measurement; photo-electric converter manufacturing; polysilicon; silicon plates; solar cells production; specific electric resistance measurement; Electrical resistance measurement; Microwave measurements; Microwave oscillators; Microwave theory and techniques; Resistance; Semiconductor device measurement; Silicon; Electrical Properties; Multicrystalline Silicon;
Conference_Titel :
Strategic Technology (IFOST), 2012 7th International Forum on
Conference_Location :
Tomsk
Print_ISBN :
978-1-4673-1772-6
DOI :
10.1109/IFOST.2012.6357754
