DocumentCode :
2285822
Title :
Cell-cell adhesion force measurement using nano picker via nanorobotic manipulators inside ESEM
Author :
Shen, Yajing ; Ahmad, Mohd Ridzuan ; Nakajima, Masahiro ; Kojima, Seiji ; Homma, Michio ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
fYear :
2010
fDate :
17-20 Aug. 2010
Firstpage :
870
Lastpage :
874
Abstract :
Cell-cell adhesion force is important for cell activities. In this paper, a novel cell-cell adhesion force measurement method using nano picker was proposed based on the nanorobotic manipulation system inside an environmental scanning electron microscopy (ESEM). The nano picker was fabricated from atomic force microscopy(AFM) cantilever by focused ion beam(FIB) etching. The spring constant of the nano picker was calibrated by nano manipulation approach. The cell which was selected for adhesion force measurement was first positioned on the top of another cell by a micro probe. Then, the nano picker was inserted to the join area between the two cells. Finally, the nano picker lifted the top cell by the actuating of nano manipulator inside environmental scanning electron microscopy ESEM. The cell-cell adhesion force can be measured based on the deflection of the cantilever during the cell separation. This method allowed the observation and manipulation of cell at nano scale simultaneously. Study of cell adhesion will benefit the understanding the mechanism of cell spreading, proliferation and so on.
Keywords :
adhesion; atomic force microscopy; biomechanics; cellular biophysics; focused ion beam technology; force measurement; manipulators; nanobiotechnology; nanomechanics; scanning electron microscopy; sputter etching; AFM; ESEM; FIB etching; atomic force microscopy; cell spreading; cell-cell adhesion; environmental scanning electron microscopy; focused ion beam; force measurement; nanopicker; nanorobotic manipulators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
ISSN :
1944-9399
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2010.5697834
Filename :
5697834
Link To Document :
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