DocumentCode :
2285957
Title :
Formation of 3D Ge quantum dots array for advanced photovolatics in layer-cake technique
Author :
Chien, C.Y. ; Chang, Y.R. ; Chang, R.N. ; Lee, M.S. ; Li, W.
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhong Li, Taiwan
fYear :
2010
fDate :
17-20 Aug. 2010
Firstpage :
924
Lastpage :
927
Abstract :
Placement of quantum dots (QDs) and insight into QD´s basic internal structure and optical properties lay nature cornerstones for advanced photonic devices. We report a manageable growth method for placing dense three-dimensional Ge QD arrays in a uniform or a grading size distribution, using thermal oxidation of poly-SiGe in layer-cake techniques. The QD size and spatial density in each stack could be well modulated by Ge content in poly-Si1-xGex, oxidation and underlay buffer layer conditions. Size-dependent internal structure, strain, and photoluminesce properties of Ge QDs are systematically investigated. Optimization of processing conditions was carried out for producing dense Ge QD arrays for maximizing photovoltaic efficiency.
Keywords :
CVD coatings; Ge-Si alloys; elemental semiconductors; germanium; photoelectric devices; photoluminescence; quantum dots; 3D quantum dots array formation; Ge; SiGe; advanced photonic device; advanced photovolatic; grading size distribution; internal structure; layer cake technique; manageable growth method; photoluminesce property; processing condition optimization; quantum dot placement; spatial density; strain; thermal oxidation; underlay buffer layer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
ISSN :
1944-9399
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2010.5697842
Filename :
5697842
Link To Document :
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