• DocumentCode
    228596
  • Title

    Modelling of HEMT for high power switching application using polarization engineering technique

  • Author

    Mathew, Aldona ; Nirmal, D. ; Prajoon, P. ; George, Abin

  • Author_Institution
    Dept. of Electron. & Commun., Karunya Univ., Coimbatore, India
  • fYear
    2014
  • fDate
    13-14 Feb. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A normally-off field effect transistor (FET) is designed engineering polarization in Ga-face GaN-based heterostructures with a GaN caplayer and an AlGaN/p-GaN back barrier. This dissertation focuses on development of enhancement-mode AlGaN/GaN HEMTs for high-voltage switching applications. From the simulation results it is seen that an unintentionally doped GaN cap and p-GaN layer depletes the electrons in the channel and presence of Al0.2Ga0.8N back barrier pinches off the channel. A positive gate voltage of 0.4 V is achieved for 80 μm long gate devices. The structure does not require any dry etching process for fabrication which makes more uniform and repeatable threshold voltage control in normally-off AlGaN/GaN heterostructure FETs for power switching application.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; power semiconductor switches; semiconductor device models; voltage control; wide band gap semiconductors; AlGaN-GaN; AlGaN-GaN HEMT; AlGaN-p-GaN back barrier; FET; Ga-face GaN-based heterostructures; GaN caplayer; doped GaN cap; gate devices; high power switching application; normally-off field effect transistor; p-GaN layer; polarization engineering technique; size 80 mum; voltage 0.4 V; voltage control; Aluminum gallium nitride; Gallium nitride; HEMTs; Lead; MODFETs; Substrates; AlGaN/p-GaNback barrier; GaN cap; Normally-off III-nitride heterostructures; polarization engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Communication Systems (ICECS), 2014 International Conference on
  • Conference_Location
    Coimbatore
  • Print_ISBN
    978-1-4799-2321-2
  • Type

    conf

  • DOI
    10.1109/ECS.2014.6892690
  • Filename
    6892690