DocumentCode
2286238
Title
Silicon germanium heterojunction bipolar technology: the next leap in silicon?
Author
Cressler, J.D. ; Harame, D.L. ; Comfort, J.H. ; Stork, J.M.C. ; Meyerson, B.S. ; Tice, T.E.
Author_Institution
Dept. of Electr. Eng., Auburn Univ., AL, USA
fYear
1994
fDate
16-18 Feb. 1994
Firstpage
24
Lastpage
27
Abstract
SiGe heterostructure bipolar transistor (HBT) technology will allow circuit designers to combine the performance historically associated with compound semiconductor technologies such as GaAs with the integration levels, yield, and cost associated with conventional Si processing. At present, unloaded SiGe ECL circuits switch at sub20ps speeds, transistors exhibit cutoff frequencies in excess of 100GHz, and integration levels high enough to realize a 1.OGHz/1.OW 12b DAC have been achieved. SiGe HBT technology is advancing rapidly, and is nearing the point at which it can be considered a practical device technology.<>
Keywords
Ge-Si alloys; bipolar integrated circuits; heterojunction bipolar transistors; integrated circuit technology; semiconductor materials; 100 GHz; 20 ps; DAC; ECL circuits; SiGe; SiGe HBT technology; circuit design; cost; cutoff frequencies; integration levels; silicon germanium heterojunction bipolar technology; speed; transistors; yield; CMOS technology; Circuits; Costs; Gallium arsenide; Germanium silicon alloys; Heterojunction bipolar transistors; Photonic band gap; Semiconductor films; Silicon germanium; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1994. Digest of Technical Papers. 41st ISSCC., 1994 IEEE International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-1844-7
Type
conf
DOI
10.1109/ISSCC.1994.344742
Filename
344742
Link To Document