Title :
Modified flyback for HID supply: Design, modeling and control
Author :
Pappis, Douglas ; Schittler, Andressa C. ; Pause, Jonas R. ; Costa, Marco A D ; Campos, Alexandre ; Alonso, J. Marcos
Author_Institution :
Electron. Ballasts Res. Group-GEDRE, Univ. Fed. de Santa Maria-UFSM, Santa Maria, Brazil
Abstract :
This paper presents a ballast for driving high intensity discharge (HID) lamps with low frequency square waveform from a dc supply, with expansion for integrated PFC (buck-boost converter). From the dc source (battery or PFC rail), a flyback arrangement is inserted into a switching structure whose output provides low frequency voltage yet avoiding instability issues. Proposal´s main advantage is the need for reduced chokes count and two active switches only. Converter design for DCM is presented in this work, besides an equivalent circuit from a control point of view. Small signal ac model is obtained and feedback control loop designed based upon frequency response. HID dynamics is inserted into converter model, with feedback directly implemented. For design conformity, experimental and simulation results from Matlab and PSIM are presented, as well as discussions about its feasibility.
Keywords :
DC-AC power convertors; control system synthesis; discharge lamps; equivalent circuits; feedback; frequency response; lighting control; switching convertors; DCM converter design; HID dynamics; HID supply flyback design; active switch; buck-boost converter; choke count reduction; dc source; dc supply; equivalent circuit; feedback control loop design; frequency response; high intensity discharge lamps; instability issue; integrated PFC; low frequency square waveform; low frequency voltage; small signal ac model; switching structure; Electronic ballasts; High intensity discharge lamps; Impedance; Switches; HID lamps; closed loop; discontinuous conduction mode; feedback; flyback; integrated PFC; lamp modeling; lighting; small-signal ac model;
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2011 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-9498-9
DOI :
10.1109/IAS.2011.6074377