• DocumentCode
    2286411
  • Title

    Automatic Classification of Power Quality Events Using Multiwavelets

  • Author

    Dahiya, Surender ; Jain, D.K. ; Kumar, Manish ; Kumar, Ashok ; Kapoor, Rajiv

  • Author_Institution
    Dept. of Electr. Eng., C.R. State Coll. of Eng., Murthal
  • fYear
    2006
  • fDate
    12-15 Dec. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Multiwavelets technique is here proposed to classify the power quality (PQ) events. This leads to easy extraction of feature set. In the proposed classification scheme initially the events are detected from the test data in accordance with the IEEE standards. Then, two sub-classifiers, namely, chi-square distribution and heuristic classifier with different confidence levels have been used along with the Dempster-Shafer (DS) class for final decision making.
  • Keywords
    decision making; feature extraction; power supply quality; wavelet transforms; Dempster-Shafer class; IEEE standard; chi-square distribution; decision making; feature set extraction; multiwavelets technique; power quality event; Feature extraction; Filter bank; Harmonic distortion; Image coding; Multiresolution analysis; Power quality; Power systems; Testing; Voltage; Wavelet analysis; Event Classification; Multiwavelets; Power Quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics, Drives and Energy Systems, 2006. PEDES '06. International Conference on
  • Conference_Location
    New Delhi
  • Print_ISBN
    0-7803-9772-X
  • Electronic_ISBN
    0-7803-9772-X
  • Type

    conf

  • DOI
    10.1109/PEDES.2006.344239
  • Filename
    4147946