DocumentCode
2286411
Title
Automatic Classification of Power Quality Events Using Multiwavelets
Author
Dahiya, Surender ; Jain, D.K. ; Kumar, Manish ; Kumar, Ashok ; Kapoor, Rajiv
Author_Institution
Dept. of Electr. Eng., C.R. State Coll. of Eng., Murthal
fYear
2006
fDate
12-15 Dec. 2006
Firstpage
1
Lastpage
5
Abstract
Multiwavelets technique is here proposed to classify the power quality (PQ) events. This leads to easy extraction of feature set. In the proposed classification scheme initially the events are detected from the test data in accordance with the IEEE standards. Then, two sub-classifiers, namely, chi-square distribution and heuristic classifier with different confidence levels have been used along with the Dempster-Shafer (DS) class for final decision making.
Keywords
decision making; feature extraction; power supply quality; wavelet transforms; Dempster-Shafer class; IEEE standard; chi-square distribution; decision making; feature set extraction; multiwavelets technique; power quality event; Feature extraction; Filter bank; Harmonic distortion; Image coding; Multiresolution analysis; Power quality; Power systems; Testing; Voltage; Wavelet analysis; Event Classification; Multiwavelets; Power Quality;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics, Drives and Energy Systems, 2006. PEDES '06. International Conference on
Conference_Location
New Delhi
Print_ISBN
0-7803-9772-X
Electronic_ISBN
0-7803-9772-X
Type
conf
DOI
10.1109/PEDES.2006.344239
Filename
4147946
Link To Document