DocumentCode
2286483
Title
Nonthermal effects on microwave radiation on ionic diffusion in ionic crystalline ceramics
Author
Freeman, S.A. ; Booske, J.H. ; Cooper, R.F.
Author_Institution
Dept. of Astron., Wisconsin Univ., Madison, WI, USA
fYear
1995
fDate
5-8 June 1995
Firstpage
214
Abstract
Summary form only given, as follows. Numerous claims have been made of observations that microwave heating of ceramics promotes faster processing or solid state reactions (e.g., sintering, bonding, tracer ion diffusion) than conventional furnace heating. These claims are controversial due to the absence of a verifiable theoretical explanation as well as questions on the interpretation of sample temperature measurements obtained in the presence of microwave fields or during microwave heating. A recent experimental investigation has clearly established that intense microwave fields can yield enhanced ion (or vacancy) diffusion in ionic crystalline ceramics. The results are in qualitative agreement with a model in which the microwave fields exert a ponderomotive or radiation pressure acting near the surfaces of NaCl crystals or grains. It is believed that this phenomenon explains the observations of microwave-enhanced tracer ion diffusion in higher temperature oxide ceramics and glasses. Future work will explore the role of this phenomenon in grain boundary diffusion and sintering during microwave processing of ceramics.
Keywords
ceramics; diffusion; microwave heating; NaCl; NaCl crystals; NaCl grains; bonding; furnace heating; glasses; grain boundary diffusion; high temperature oxide ceramics; ionic crystalline ceramics; ionic diffusion; microwave fields; microwave heating; microwave processing; microwave radiation; microwave-enhanced tracer ion diffusion; nonthermal effects; ponderomotive pressure; processing; radiation pressure; sample temperature; sintering; solid state reactions; tracer ion diffusion; vacancy diffusion; Ceramics; Crystallization; Diffusion bonding; Electromagnetic heating; Furnaces; Glass; Grain boundaries; Near-field radiation pattern; Solid state circuits; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location
Madison, WI, USA
ISSN
0730-9244
Print_ISBN
0-7803-2669-5
Type
conf
DOI
10.1109/PLASMA.1995.531754
Filename
531754
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