DocumentCode :
228649
Title :
Determining base transit time of anAlyGa1−yAs HBT using the analytical model developed for SiGe device with exponentially doped base
Author :
Arafat, Yeasir ; Mannan, Rowshon Ara ; Biswas, Priyanka ; Jahan, Nusrat
Author_Institution :
Dept. of Electr. & Electron. Eng., Bangladesh Univ. of Eng. & Tech. (BUET), Dhaka, Bangladesh
fYear :
2014
fDate :
13-14 Feb. 2014
Firstpage :
1
Lastpage :
5
Abstract :
Base transit time (BTT) of a graded base AlGaAs Heterojunction Bipolar Transistor (HBT)has been determined by using the analytical model previously developed for a SiGe HBT (arafatetal.). While thinking about the expansion of the SiGe BTT model for any other ternary compound semiconductor material like AlGaAs, the previous model could not be used directly because most of the parameters used in the model depend on the materials used. The novel part of the present work is that the authors investigated published literature for those parameters associated with AlGaAs and fed them into the SiGe model, determined the BTT and verified the results.
Keywords :
Ge-Si alloys; III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlyGa1-yAs; BTT model; HBT; SiGe; analytical model; base transit time determination; exponentially doped base; heterojunction bipolar transistor; ternary compound semiconductor material; Doping; Heterojunction bipolar transistors; Microwave amplifiers; Microwave measurement; Silicon; Silicon germanium; Base transit time of AlGaAs; exponential doping; graded base; ternary compound semiconductor HBT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Communication Systems (ICECS), 2014 International Conference on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4799-2321-2
Type :
conf
DOI :
10.1109/ECS.2014.6892716
Filename :
6892716
Link To Document :
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