Title :
A novel algorithm for the restoration of AFM/STM images
Author :
Yu, Tian-Hu ; Mitra, Sanjit K.
Author_Institution :
Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
Abstract :
Images generated from the scanning tunneling microscope (STM) or atomic force microscope (AFM) imaging system can show microstructures of samples. However, resulting AFM/STM images are sometimes corrupted by streaks. Thus, to suppress such streaks becomes an important task in the processing of AFM/STM images. We analyze the generation of streaks, introduce a degradation model of the corrupted AFM/STM image, and then propose an adaptive notch filtering algorithm to remove the streaks. Some simulation results support the analysis and indicate the performance of the proposed algorithm
Keywords :
adaptive filters; digital filters; image reconstruction; notch filters; scanning electron microscope examination of materials; AFM/STM images; adaptive notch filtering algorithm; atomic force microscope; degradation model; image restoration; imaging system; microstructures; performance; samples; scanning tunneling microscope; simulation results; streaks suppression; Algorithm design and analysis; Analytical models; Atomic force microscopy; Degradation; Filtering algorithms; Image analysis; Image generation; Image restoration; Microstructure; Tunneling;
Conference_Titel :
Speech, Image Processing and Neural Networks, 1994. Proceedings, ISSIPNN '94., 1994 International Symposium on
Print_ISBN :
0-7803-1865-X
DOI :
10.1109/SIPNN.1994.344794
