• DocumentCode
    2286602
  • Title

    Micromachined planar probe using half-SIW and half-shielded stripline structure for permittivity measurement

  • Author

    Bang, Yong-Seung ; Kim, Namgon ; Kim, Jung-Mu ; Cheon, Changyul ; Kwon, Youngwoo ; Kim, Yong-Kweon

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    1121
  • Lastpage
    1124
  • Abstract
    This paper reports on a micromachined planar type probe based on a novel hybrid shielded stripline. The proposed structure is for a broadband transverse electromagnetic (TEM) single-mode propagation using substrate integrated waveguide (SIW) and conventional shielded stripline. We suggested a novel probe structure that composed of half-SIW and half-shielded stripline, which combined through a benzocyclobutene (BCB) bonding layer. The structural concept and simple fabrication method has been introduced, and the S11 in air was measured from 0.5 GHz to 30 GHz. The permittivity measurement of 0.9 % saline has been performed to validate the proposed structure at frequencies from 0.5 GHz to 20 GHz.
  • Keywords
    micromachining; microwave propagation; permittivity measurement; probes; strip lines; substrate integrated waveguides; benzocyclobutene bonding layer; frequency 0.5 GHz to 30 GHz; half-shielded stripline structure; micromachined planar probe; permittivity measurement; substrate integrated waveguide; transverse electromagnetic single-mode propagation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697874
  • Filename
    5697874