DocumentCode
2286602
Title
Micromachined planar probe using half-SIW and half-shielded stripline structure for permittivity measurement
Author
Bang, Yong-Seung ; Kim, Namgon ; Kim, Jung-Mu ; Cheon, Changyul ; Kwon, Youngwoo ; Kim, Yong-Kweon
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear
2010
fDate
17-20 Aug. 2010
Firstpage
1121
Lastpage
1124
Abstract
This paper reports on a micromachined planar type probe based on a novel hybrid shielded stripline. The proposed structure is for a broadband transverse electromagnetic (TEM) single-mode propagation using substrate integrated waveguide (SIW) and conventional shielded stripline. We suggested a novel probe structure that composed of half-SIW and half-shielded stripline, which combined through a benzocyclobutene (BCB) bonding layer. The structural concept and simple fabrication method has been introduced, and the S11 in air was measured from 0.5 GHz to 30 GHz. The permittivity measurement of 0.9 % saline has been performed to validate the proposed structure at frequencies from 0.5 GHz to 20 GHz.
Keywords
micromachining; microwave propagation; permittivity measurement; probes; strip lines; substrate integrated waveguides; benzocyclobutene bonding layer; frequency 0.5 GHz to 30 GHz; half-shielded stripline structure; micromachined planar probe; permittivity measurement; substrate integrated waveguide; transverse electromagnetic single-mode propagation;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location
Seoul
ISSN
1944-9399
Print_ISBN
978-1-4244-7033-4
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2010.5697874
Filename
5697874
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