DocumentCode :
2286609
Title :
Scanning Kelvin Probe Force Microscopy for investigation of charge transport in carbon-nanotube enhanced organic photovoltaics
Author :
Liu, Liming ; Li, Guangyong
Author_Institution :
Dept. of Electr. & Comput. Eng., Univerisity of Pittsburgh, Pittsburgh, PA, USA
fYear :
2010
fDate :
17-20 Aug. 2010
Firstpage :
1145
Lastpage :
1148
Abstract :
As a powerful tool to study surface potential difference at nanometer scale, canning Kelvin Probe Force Microscopy (KPFM) has been applied to investigate the photoexcited charge transport in single-walled carbon nanotubes (SWCNTs) enhanced organic solar cells. By comparing surface potential images of SWCNTs on regioregular poly 3-hesylthiophene (P3HT) and 6,6-phenyl C61-butyric acid methyl ester (PCBM) blended film in the dark and under illumination, it is observed that photoinduced holes flow from active layer to SWCNTs, which indicates that SWCNTs work as donor materials. The transport of holes from organic materials to SWCNTs verifies that the improved performance of P3HT/PCBM/SWCNTs bulk heterojunction solar cells is attributed to the increased hole mobility in ballistic pathways provided by SWCNTs instead of slow hopping and tunneling in disordered organic materials.
Keywords :
atomic force microscopy; ballistic transport; carbon nanotubes; hole mobility; organic semiconductors; photoelectricity; polymer blends; solar cells; 6,6-phenyl C61-butyric acid methyl ester; C; P3HT; PCBM; ballistic pathways; blended film; carbon nanotube enhanced organic photovoltaics; charge transport investigation; hole mobility; hole transport; organic materials; organic solar cell; photoexcited charge transport; poly 3-hesylthiophene; scanning Kelvin probe force microscopy; single walled carbon nanotubes; surface potential difference; surface potential image;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
ISSN :
1944-9399
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2010.5697875
Filename :
5697875
Link To Document :
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