• DocumentCode
    2286658
  • Title

    Development and testing of a real-time digital voltage flickermeter

  • Author

    Fallen, C.M. ; Mcdermott, Brian A.

  • Author_Institution
    Duke Power Co., Charlotte, NC, USA
  • fYear
    1996
  • fDate
    15-20 Sep 1996
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    One parameter of power quality that traditionally has been very difficult to monitor is voltage flicker. Voltage flicker can cause objectionable light fluctuations and disruption of sensitive electronic equipment. Presented here are the results from the development and testing of a new real-time digital voltage flickermeter. The new meter utilizes digital signal processor (DSP) technology and digital algorithms to determine the magnitude and frequencies of instantaneous voltage flicker level in real-time. The flickermeter was used to monitor the voltage flicker on 21 distribution circuits with known large fluctuating loads. The results of this study are correlated with customer complaints on the monitored circuits. A comparison of measured voltage flicker levels on circuits with complaints and circuits without complaints with the existing “GE Flicker Curves”
  • Keywords
    computerised instrumentation; digital voltmeters; distribution networks; harmonic distortion; power supply quality; power system harmonics; power system measurement; real-time systems; voltage measurement; DSP technology; GE Flicker Curves; digital algorithms; digital signal processor; distribution circuits; fluctuating loads; light fluctuations; power quality; real-time digital voltage flickermeter; sensitive electronic equipment; voltage flicker levels; Circuit testing; Condition monitoring; Digital signal processing; Digital signal processors; Electronic equipment; Frequency; Power quality; Signal processing algorithms; Voltage fluctuations; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference, 1996. Proceedings., 1996 IEEE
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    0-7803-3522-8
  • Type

    conf

  • DOI
    10.1109/TDC.1996.545910
  • Filename
    545910