Title :
High performance arcing fault localization in distribution networks
Author :
Zhou, J. ; Ayhan, B. ; Kwan, C. ; Liang, S. ; Lee, W.
Author_Institution :
Signal Process., Inc., Rockville, MD, USA
Abstract :
Con Edison experiences more than 1000 arcing faults on its secondary distribution system each year. Arcing faults introduce strong harmonics into the power network. We propose a fast, low cost, and high performance approach to localizing arcing faults based on harmonics. First, we implemented 2 novel algorithms. One is based on voltage ratio of harmonics. This method can detect arcing fault one at a time. The second one is based on sparse sensing, which is a powerful technique that can detect multiple faults and is robust to measurement noise. Both methods require low cost voltage measurements; no high cost sensors are required. In addition, the computations can be done very quickly within a few cycles (<;50ms). Second, we have performed extensive simulation studies using IEEE 14-bus system, IEEE 18-bus system, IEEE 118-bus system, and a 454-bus system. We only need to measure the voltages of a small percentage of the nodes. For example, voltages from only 20% of the nodes in a 454-bus system are needed for accurate fault localization. Multiple simultaneous faults can be localized. All the results clearly demonstrated the localization accuracy of our algorithms.
Keywords :
arcs (electric); power distribution faults; power system harmonics; voltage measurement; 454-bus system; IEEE 118-bus system; IEEE 14-bus system; IEEE 18-bus system; arcing fault detection; distribution networks; harmonic voltage ratio; high-performance arcing fault localization; measurement noise; power network harmonics; secondary distribution system; sparse sensing; voltage measurements; Capacitors; Current measurement; Fault currents; Generators; Harmonic analysis; Indexes; arcing fault; fault localization; power distribution network; sparsity recovery;
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2011 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-9498-9
DOI :
10.1109/IAS.2011.6074403